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商品名称：正版包邮有机薄膜的表征合成树脂与塑料工业书籍9787560342870

商品编号：612971170808

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重量：0.000千克

上架时间：2021-05-09 19:07:20

ISBN编号：9787560342870

书名：有机薄膜的表征,有机薄膜的表征

作者：布伦德尔,(C.Richard,Brundle),　著

出版社名称：哈尔滨工业大学出版社

定价：98.00元

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  基本信息书名：  有机薄膜的表征作者：  C. Richard Brundle，Charles A. Evans, Jr[主编] 出版社：  哈尔滨工业大学出版社出版日期：  2014-01-01 版次：  1 ISBN：  9787560342870 市场价：  98.0 目录 Preface to the Reissue of the Materials Characterization Series Preface to Series Preface to the Reissue of Characterization of Organic Thin Films Preface Contributors PART Ⅰ： PREPARATION A ...

基本信息

书名：

有机薄膜的表征

作者：

C. Richard Brundle，Charles A. Evans, Jr[主编]

出版社：

哈尔滨工业大学出版社

出版日期：

2014-01-01

版次：

ISBN：

9787560342870

市场价：

98.0

目录 Preface to the Reissue of the Materials Characterization Series
Preface to
Series
Preface to the Reissue of Characterization of Organic Thin Films
Preface
Contributors
PART Ⅰ： PREPARATION AND MATERIALS
LANGMUIR—BLODGETT FILMS
1.1 Introduction
1.2 L—B Films ofLong—Chain
Compounds
FattyAcids
Amines
Other Long—Chain Compounds
1.3
Cyclic Compounds and Chromophores
1.4 Polymers and Proteins
1.5
Polymerization In Situ
1.6 Alternation Films （Superlattices）
1.7
PotentiaIApplications
SELF—ASSEMBLED MONOIAYERS
2.1 Introduction
2.2
Monolayers of Fatty Acids
2.3 Monolayers of Organosilicon Derivatives
2.4 Monolayers of Alkanethiolates on Metal and Semiconductor Surfaces
2.5 Self—Assembled Monolayers Containing Aromatic Groups
2.6 Conclusions
PARTⅡ： ANALYSIS OF FILM AND SURFACEPROPERTIES
SPECTROSCOPIC ELLIPSOMETRY
3.1 Introduction and Overview
3.2 Theory of Ellipsometry
3.3
Instrumentation
3.4 Determination of Optical Properties
Analysis of
Single Eliipsometric Spectra： Direct Inversion Methods
Analysis of Single
Ellipsometric Spectra： Least— Squares Regression Analysis Method
Analysis of
Multiple Ellipsometric Spectra
3.5 Determination of Thin Film Structure
Thickness Determination for Monolayers
Microstructural Evolution in
Thick Film Growth
3.6 Future Prospects
INFRARED SPECTROSCOPYIN THE
CHARACTERIZATION OF ORGANIC THIN FILMS
4.1 Introduction
Specific Needs
for Characterizing Organic Thin Films
General Prinaples and Capabilities of
Infrared Spectroscopy for Surface and Thin Film Analysis
4.2 Quantitative
Aspects
Spectroscopiclntensities
Electromagnetic Fields in Thin Film
Structures
4.3 The Infrared Spectroscopic Experiment
General
Instrumentation
Experimental Modes
Additional Aspects
4.4 Examples
of Applications
Self—Assembled Monolayers on Gold by External Reflection
Octadecylsiloxane Monolayers on SiO2 byTransmission
Langmuir—Blodgett
Films on Nonmetallic Substrates by External Reflection
RAMAN SPECTROSCOPIC
CHARACTERIZATION OF ORGANIC THIN FILMS
5.1 Introduction
5.2
FundamentalsofRaman Spectroscopy
5.3 InstrumentaIConsiderations
5.4
Raman Spectroscopic Approaches for the Characterization ofOrganicThin Films
Integrated OpticaIWaveguide Raman Spectroscopy （IOWRS）
Total Internal
Reflection Raman Spectroscopy
Surface Enhanced Raman Scattering
Normal
Raman Spectroscopy
Resonance Raman Spectroscopy
Plasmon Surface
Polariton Enhanced Raman Spectroscopy
FourierTransform Raman Spectroscopy
Waveguide Surface Coherent Anti—Stokes Raman Spectroscopy（WSCARS）
5.5
Selected Examples of Thin Film Analyses
Raman Spectral Characterization 内容介绍

　　《材料表征原版系列丛书:有机薄膜的表征(英文)》主要内容包括：PREPARATION AND MATERIALS LANGMUIR—BLODGETT FILMS、L—B Films ofLong—Chain Compounds、Cyclic Compounds and Chromophores、Polymers and Proteins、Polymerization In Situ、Alternation Films （Superlattices）、SELF—ASSEMBLED MONOIAYERS等。

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